Aydin H.Bacaksiz C.Yagmurcukardes N.Karakaya C.Mermer O.Can M.Senger R.T.Sahin H.Selamet Y.2024-07-222024-07-22201801694332http://akademikarsiv.cbu.edu.tr:4000/handle/123456789/15020We have investigated the effect of two different self-assembled monolayers (SAMs) on electrical characteristics of bilayer graphene (BLG)/n-Si Schottky diodes. Novel 4″bis(diphenylamino)-1, 1′:3″-terphenyl-5′ carboxylic acids (TPA) and 4,4-di-9H-carbazol-9-yl-1,1′:3′1′-terphenyl-5′ carboxylic acid (CAR) aromatic SAMs have been used to modify n-Si surfaces. Cyclic voltammetry (CV) and Kelvin probe force microscopy (KPFM) results have been evaluated to verify the modification of n-Si surface. The current–voltage (I–V) characteristics of bare and SAMs modified devices show rectification behaviour verifying a Schottky junction at the interface. The ideality factors (n) from ln(I)–V dependences were determined as 2.13, 1.96 and 2.07 for BLG/n-Si, BLG/TPA/n-Si and BLG/CAR/n-Si Schottky diodes, respectively. In addition, Schottky barrier height (SBH) and series resistance (R s ) of SAMs modified diodes were decreased compared to bare diode due to the formation of a compatible interface between graphene and Si as well as π–π interaction between aromatic SAMs and graphene. The CAR-based device exhibits better diode characteristic compared to the TPA-based device. Computational simulations show that the BLG/CAR system exhibits smaller energy-level-differences than the BLG/TPA, which supports the experimental findings of a lower Schottky barrier and series resistance in BLG/CAR diode. © 2017 Elsevier B.V.EnglishAll Open Access; Green Open AccessAromatic compoundsCarboxylic acidsCyclic voltammetryDiodesElectric rectifiersElectric resistanceGrapheneSelf assembled monolayersSemiconductor junctionsSemiconductor metal boundariesSilicon compoundsComputational investigationComputational simulationDiode characteristicsElectrical characteristicKelvin probe force microscopySamsSchottky barrier heightsSchottky diodesSchottky barrier diodesExperimental and computational investigation of graphene/SAMs/n-Si Schottky diodesArticle10.1016/j.apsusc.2017.09.204