Improving the resolution of beta scattering spectroscopy
| dc.contributor.author | Celiktas, C | |
| dc.contributor.author | Selvi, S | |
| dc.contributor.author | Yegin, G | |
| dc.date.accessioned | 2025-04-10T10:33:25Z | |
| dc.date.available | 2025-04-10T10:33:25Z | |
| dc.description.abstract | We have examined the performance of a modified beta-ray spectrometer using a pulse shape analyzer/timing single channel analyzer and related electronics, thereby preserving the low energy electron tail in measurement of the scattered electron spectra from an n-type Si wafer target. Comparison of measurements with the scattering spectra calculated by the Monte Carlo program EGS4 indicates good agreement across a significant part of the spectrum, an exception being for the energy region 30-100 keV. Re-evaluation of existing scattering cross-sections would be useful, as would possible geometrical effects of the scattering arrangement used herein. Present efforts seek to contribute to the evaluation of electron scattering cross-sections and improvement in theoretical models. (C) 2004 Elsevier Ltd. All rights reserved. | |
| dc.identifier.issn | 0969-806X | |
| dc.identifier.uri | http://hdl.handle.net/20.500.14701/39701 | |
| dc.language.iso | English | |
| dc.title | Improving the resolution of beta scattering spectroscopy | |
| dc.type | Article |