Effects of thermal oxidation temperature on vacuum evaporated tin dioxide film

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dc.contributor.authorÇakmak H.M.
dc.contributor.authorÇetinkara H.A.
dc.contributor.authorKahraman S.
dc.contributor.authorBayansal F.
dc.contributor.authorTepe M.
dc.contributor.authorGüder H.S.
dc.contributor.authorÇipiloǧlu M.A.
dc.date.accessioned2024-07-22T08:19:31Z
dc.date.available2024-07-22T08:19:31Z
dc.date.issued2012
dc.description.abstractIn order to investigate the effect of thermal oxidation temperature on tin dioxide (SnO 2), tin dioxide films were obtained on quartz substrates by vacuum evaporation of tin metal. The films were characterized by X-ray diffraction (XRD) analyses, scanning electron microscopy (SEM), temperature dependent electrical resistivity measurement and optical absorption spectroscopy. The SEM images showed that the films are dense, continuous and are composed of nanoparticles and particle sizes are increased after thermal oxidation. From the X-ray measurement results, the films indicated two strong reflection peaks of tetragonal structure in the orientations of (1 0 1) and (2 0 0) at 2θ = 33.89°and 37.95°, respectively. Intensity of the peaks increased with increasing thermal oxidation temperature. We found resistivity values of about 10 -4 Ω-cm. Optical absorption spectra of the films in the UV-Vis spectral range revealed that optical band gap (E g) value of the films increases with increasing thermal oxidation temperature. © 2012 Elsevier Ltd. All rights reserved.
dc.identifier.DOI-ID10.1016/j.spmi.2012.01.006
dc.identifier.issn10963677
dc.identifier.urihttp://akademikarsiv.cbu.edu.tr:4000/handle/123456789/17721
dc.language.isoEnglish
dc.subjectElectric conductivity
dc.subjectQuartz
dc.subjectScanning electron microscopy
dc.subjectThermal evaporation
dc.subjectTin
dc.subjectVacuum evaporation
dc.subjectX ray diffraction
dc.subjectElectrical resistivity measurements
dc.subjectQuartz substrate
dc.subjectReflection peaks
dc.subjectResistivity values
dc.subjectSEM image
dc.subject
dc.subjectSpectral range
dc.subjectTemperature dependent
dc.subjectTetragonal structure
dc.subjectThermal oxidation
dc.subjectTin dioxide film
dc.subjectX ray measurements
dc.subjectOxidation
dc.titleEffects of thermal oxidation temperature on vacuum evaporated tin dioxide film
dc.typeArticle

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