Thickness dependence of magnetic properties of Co 90Fe 10 nanoscale thin films

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dc.contributor.authorYalçin O.
dc.contributor.authorKazan S.
dc.contributor.authorŞahingöz R.
dc.contributor.authorYildiz F.
dc.contributor.authorYerli Y.
dc.contributor.authorAktaş B.
dc.date.accessioned2024-07-22T08:22:23Z
dc.date.available2024-07-22T08:22:23Z
dc.date.issued2008
dc.description.abstractFerromagnetic monolayers Co 90Fe 10 thin films with individual layer thicknesses 2, 6, and 8 nm were grown on thermally oxidized Si substrate and magnetic properties of these were investigated with Ferromagnetic resonance (FMR) technique at room temperature. The magnetoresistance (MR) of the samples were measured as a function of applied DC magnetic field and the thickness dependence of the MR was plotted. The FMR spectra were recorded for both parallel and perpendicular geometry. The X-band (9.5 GHz) FMR spectra and resonance field of samples were analyzed and fitted theoretically by using the Landau-Lifshits dynamic equation of motion for magnetization with the Bloch-Bloembergen type damping term. The computer programs have been written to extract the effective magnetization (M), g-values and spin-spin relaxation time (T 2) fitting parameters. The thickness dependence of magnetic parameters has been obtained from experimental data by mean of a theoretical model. Copyright © 2008 American Scientific Publishers All rights reserved.
dc.identifier.DOI-ID10.1166/jnn.2008.B029
dc.identifier.issn15334880
dc.identifier.urihttp://akademikarsiv.cbu.edu.tr:4000/handle/123456789/19058
dc.language.isoEnglish
dc.subjectFerromagnetic materials
dc.subjectFerromagnetic resonance
dc.subjectMagnetoresistance
dc.subjectMonolayers
dc.subjectThin films
dc.subjectFitting parameters
dc.subjectPerpendicular geometry
dc.subjectThickness dependence
dc.subjectNanostructured materials
dc.titleThickness dependence of magnetic properties of Co 90Fe 10 nanoscale thin films
dc.typeConference paper

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