Characterization and determination of mechanical properties of ybco superconducting thin films with manganese using the tfa-mod method
| dc.contributor.author | Culha O. | |
| dc.contributor.author | Birlik I. | |
| dc.contributor.author | Toparli M. | |
| dc.contributor.author | Celik E. | |
| dc.contributor.author | Engel S. | |
| dc.contributor.author | Holzapfel B. | |
| dc.date.accessioned | 2024-07-22T08:18:27Z | |
| dc.date.available | 2024-07-22T08:18:27Z | |
| dc.date.issued | 2013 | |
| dc.description.abstract | The aim of this study is to determine the microstructure, superconducting and mechanical properties of YBa2Cu3O6.56 (YBCO) and YBCO thin films with a manganese (Mn) addition. All the YBCO superconducting films (undoped and Mn-doped) were dip-coated onto (001) SrTiO3 (STO) single-crystal substrates with a metalorganic deposition using the trifluoroacetate (TFA-MOD) technique. The phase analysis, microstructure, surface morphologies and critical temperature (Tc) of the superconducting thin films were determined with an X-ray diffractometer (XRD), a scanning electron microscope (SEM), an atomic force microscope (AFM) and an inductive Tc measurement system. Since the main issue of this study is to determine the mechanical-property variations of the superconducting thin films with/without a Mn addition, the adhesion strength of these films on a STO substrate was tested with a Shimadzu scratch tester. Depending on the Mn addition, the critical forces of pure films increase from 56.23 mN, 58.63 mN and 60.11 mN for pure YBCO, YBCO with 0.05 g and 0.10 g of Mn. Furthermore, Young's modulus and the hardness of the undoped and Mn-doped YBCO thin films were measured with a CSM Berkovich nanoindenter using the load-unload sensing analysis under a 0.3 mN applied load. | |
| dc.identifier.issn | 15803414 | |
| dc.identifier.uri | http://akademikarsiv.cbu.edu.tr:4000/handle/123456789/17296 | |
| dc.language.iso | English | |
| dc.title | Characterization and determination of mechanical properties of ybco superconducting thin films with manganese using the tfa-mod method | |
| dc.type | Article |