Improving the resolution of beta scattering spectroscopy
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Date
2004
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Abstract
We have examined the performance of a modified beta-ray spectrometer using a pulse shape analyzer/timing single channel analyzer and related electronics, thereby preserving the low energy electron tail in measurement of the scattered electron spectra from an n-type Si wafer target. Comparison of measurements with the scattering spectra calculated by the Monte Carlo program EGS4 indicates good agreement across a significant part of the spectrum, an exception being for the energy region 30-100keV. Re-evaluation of existing scattering cross-sections would be useful, as would possible geometrical effects of the scattering arrangement used herein. Present efforts seek to contribute to the evaluation of electron scattering cross-sections and improvement in theoretical models. © 2004 Elsevier Ltd. All rights reserved.
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Keywords
Beta ray spectrometers , Electron scattering , Geometry , Mathematical models , Monte Carlo methods , Optical resolving power , silicon , analyzer , article , calculation , electron , electronics , energy , geometry , Monte Carlo method , spectrometry , spectroscopy , Low energy electrons , Pulse shape analyzers , Single channel analyzers , Spectroscopy