Improving the resolution of beta scattering spectroscopy

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dc.contributor.authorCeliktas C.
dc.contributor.authorSelvi S.
dc.contributor.authorYegin G.
dc.date.accessioned2024-07-22T08:24:25Z
dc.date.available2024-07-22T08:24:25Z
dc.date.issued2004
dc.description.abstractWe have examined the performance of a modified beta-ray spectrometer using a pulse shape analyzer/timing single channel analyzer and related electronics, thereby preserving the low energy electron tail in measurement of the scattered electron spectra from an n-type Si wafer target. Comparison of measurements with the scattering spectra calculated by the Monte Carlo program EGS4 indicates good agreement across a significant part of the spectrum, an exception being for the energy region 30-100keV. Re-evaluation of existing scattering cross-sections would be useful, as would possible geometrical effects of the scattering arrangement used herein. Present efforts seek to contribute to the evaluation of electron scattering cross-sections and improvement in theoretical models. © 2004 Elsevier Ltd. All rights reserved.
dc.identifier.DOI-ID10.1016/j.radphyschem.2004.03.001
dc.identifier.issn0969806X
dc.identifier.urihttp://akademikarsiv.cbu.edu.tr:4000/handle/123456789/19970
dc.language.isoEnglish
dc.subjectBeta ray spectrometers
dc.subjectElectron scattering
dc.subjectGeometry
dc.subjectMathematical models
dc.subjectMonte Carlo methods
dc.subjectOptical resolving power
dc.subjectsilicon
dc.subjectanalyzer
dc.subjectarticle
dc.subjectcalculation
dc.subjectelectron
dc.subjectelectronics
dc.subjectenergy
dc.subjectgeometry
dc.subjectMonte Carlo method
dc.subjectspectrometry
dc.subjectspectroscopy
dc.subjectLow energy electrons
dc.subjectPulse shape analyzers
dc.subjectSingle channel analyzers
dc.subjectSpectroscopy
dc.titleImproving the resolution of beta scattering spectroscopy
dc.typeArticle

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