Effects of thermal oxidation temperature on vacuum evaporated tin dioxide film

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dc.contributor.authorÇakmak, HM
dc.contributor.authorÇetinkara, HA
dc.contributor.authorKahraman, S
dc.contributor.authorBayansal, F
dc.contributor.authorTepe, M
dc.contributor.authorGüder, HS
dc.contributor.authorÇipiloglu, MA
dc.date.accessioned2024-07-18T12:03:20Z
dc.date.available2024-07-18T12:03:20Z
dc.description.abstractIn order to investigate the effect of thermal oxidation temperature on tin dioxide (SnO2), tin dioxide films were obtained on quartz substrates by vacuum evaporation of tin metal. The films were characterized by X-ray diffraction (XRD) analyses, scanning electron microscopy (SEM), temperature dependent electrical resistivity measurement and optical absorption spectroscopy. The SEM images showed that the films are dense, continuous and are composed of nanoparticles and particle sizes are increased after thermal oxidation. From the X-ray measurement results, the films indicated two strong reflection peaks of tetragonal structure in the orientations of (101) and (200) at 20 = 33.8 degrees and 37.95 degrees, respectively. Intensity of the peaks increased with increasing thermal oxidation temperature. We found resistivity values of about 10(-4) Omega-cm. Optical absorption spectra of the films in the UV-Vis spectral range revealed that optical band gap (E-g) value of the films increases with increasing thermal oxidation temperature. (C) 2012 Elsevier Ltd. All rights reserved.
dc.identifier.issn0749-6036
dc.identifier.urihttp://akademikarsiv.cbu.edu.tr:4000/handle/123456789/9054
dc.language.isoEnglish
dc.publisherACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD
dc.subjectOXIDE THIN-FILMS
dc.subjectOPTICAL-PROPERTIES
dc.subjectGAS SENSORS
dc.subjectDEPOSITION
dc.subjectFLUORINE
dc.subjectGROWTH
dc.subjectLAYERS
dc.titleEffects of thermal oxidation temperature on vacuum evaporated tin dioxide film
dc.typeArticle

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