Improving the resolution of beta scattering spectroscopy
dc.contributor.author | Celiktas, C | |
dc.contributor.author | Selvi, S | |
dc.contributor.author | Yegin, G | |
dc.date.accessioned | 2024-07-18T12:00:30Z | |
dc.date.available | 2024-07-18T12:00:30Z | |
dc.description.abstract | We have examined the performance of a modified beta-ray spectrometer using a pulse shape analyzer/timing single channel analyzer and related electronics, thereby preserving the low energy electron tail in measurement of the scattered electron spectra from an n-type Si wafer target. Comparison of measurements with the scattering spectra calculated by the Monte Carlo program EGS4 indicates good agreement across a significant part of the spectrum, an exception being for the energy region 30-100 keV. Re-evaluation of existing scattering cross-sections would be useful, as would possible geometrical effects of the scattering arrangement used herein. Present efforts seek to contribute to the evaluation of electron scattering cross-sections and improvement in theoretical models. (C) 2004 Elsevier Ltd. All rights reserved. | |
dc.identifier.issn | 0969-806X | |
dc.identifier.uri | http://akademikarsiv.cbu.edu.tr:4000/handle/123456789/7766 | |
dc.language.iso | English | |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | |
dc.subject | PULSE-SHAPE-DISCRIMINATION | |
dc.subject | ELASTIC ELECTRON BACKSCATTERING | |
dc.subject | RECOIL DETECTION | |
dc.subject | PILE-UP | |
dc.subject | SURFACES | |
dc.subject | REJECTION | |
dc.subject | PARTICLES | |
dc.title | Improving the resolution of beta scattering spectroscopy | |
dc.type | Article |