Improving the resolution of beta scattering spectroscopy

dc.contributor.authorCeliktas, C
dc.contributor.authorSelvi, S
dc.contributor.authorYegin, G
dc.date.accessioned2024-07-18T12:00:30Z
dc.date.available2024-07-18T12:00:30Z
dc.description.abstractWe have examined the performance of a modified beta-ray spectrometer using a pulse shape analyzer/timing single channel analyzer and related electronics, thereby preserving the low energy electron tail in measurement of the scattered electron spectra from an n-type Si wafer target. Comparison of measurements with the scattering spectra calculated by the Monte Carlo program EGS4 indicates good agreement across a significant part of the spectrum, an exception being for the energy region 30-100 keV. Re-evaluation of existing scattering cross-sections would be useful, as would possible geometrical effects of the scattering arrangement used herein. Present efforts seek to contribute to the evaluation of electron scattering cross-sections and improvement in theoretical models. (C) 2004 Elsevier Ltd. All rights reserved.
dc.identifier.issn0969-806X
dc.identifier.urihttp://akademikarsiv.cbu.edu.tr:4000/handle/123456789/7766
dc.language.isoEnglish
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.subjectPULSE-SHAPE-DISCRIMINATION
dc.subjectELASTIC ELECTRON BACKSCATTERING
dc.subjectRECOIL DETECTION
dc.subjectPILE-UP
dc.subjectSURFACES
dc.subjectREJECTION
dc.subjectPARTICLES
dc.titleImproving the resolution of beta scattering spectroscopy
dc.typeArticle

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