English

dc.contributor.authorLee, HJ
dc.contributor.authorLee, SH
dc.contributor.authorYildiz, F
dc.contributor.authorJeong, YH
dc.date.accessioned2024-07-18T11:55:33Z
dc.date.available2024-07-18T11:55:33Z
dc.description.abstractELSEVIER
dc.identifier.issn1873-4766
dc.identifier.urihttp://akademikarsiv.cbu.edu.tr:4000/handle/123456789/6481
dc.language.isoArticle
dc.publisher0304-8853
dc.subjectWe examined growth conditions to obtain the best quality epitaxial Co-doped ZnO thin films by the laser MBE deposition technique. The RHEED pattern and XRD analysis showed that the growth mode is layer-by-layer and a single phase of the wurtzite ZnO structure results at the optimum growth condition, that is, laser fluence, oxygen partial pressure and substrate temperature being at 0.45 J/cm(2), 1.0 x 10(-6) torr and 550 degrees C, respectively. From AFM measurements, the root mean square value of surface roughness was determined to be about 2 angstrom. The epitaxial Co-doped ZnO thin films were shown to possess intrinsic ferromagnetic ordering at room temperature. (c) 2006 Elsevier B.V. All rights reserved.
dc.titleEnglish
dc.typeSEMICONDUCTORS

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