Improving the resolution of beta scattering spectroscopy
| dc.contributor.author | Celiktas C. | |
| dc.contributor.author | Selvi S. | |
| dc.contributor.author | Yegin G. | |
| dc.date.accessioned | 2025-04-10T11:17:36Z | |
| dc.date.available | 2025-04-10T11:17:36Z | |
| dc.date.issued | 2004 | |
| dc.description.abstract | We have examined the performance of a modified beta-ray spectrometer using a pulse shape analyzer/timing single channel analyzer and related electronics, thereby preserving the low energy electron tail in measurement of the scattered electron spectra from an n-type Si wafer target. Comparison of measurements with the scattering spectra calculated by the Monte Carlo program EGS4 indicates good agreement across a significant part of the spectrum, an exception being for the energy region 30-100keV. Re-evaluation of existing scattering cross-sections would be useful, as would possible geometrical effects of the scattering arrangement used herein. Present efforts seek to contribute to the evaluation of electron scattering cross-sections and improvement in theoretical models. © 2004 Elsevier Ltd. All rights reserved. | |
| dc.identifier.DOI-ID | 10.1016/j.radphyschem.2004.03.001 | |
| dc.identifier.uri | http://hdl.handle.net/20.500.14701/52795 | |
| dc.title | Improving the resolution of beta scattering spectroscopy | |
| dc.type | Article |